| Translated title of the contribution | Device and method for automatically measuring pulse current-voltage (I-V) and pulse capacitance-voltage (C-V) semiconductor parameters |
|---|---|
| Original language | Chinese (Simplified) |
| Patent granted number | CN102116827B |
| Validity date | 23/12/30 |
| Publication status | Published - 20 Mar 2013 |
脉冲I-V与脉冲C-V半导体参数自动测量装置和方法
Xiaomang Wei (Inventor), Cezhou Zhao (Inventor), Yunlong Zhou (Inventor)
Research output: Patent