Wei Chen (Inventor), Qing Pan (Inventor)
Research output: Patent
}
TY - PAT
T1 - 嵌入式磨机衬板磨损监测系统
AU - Chen, Wei
AU - Pan, Qing
PY - 2023/2/21
Y1 - 2023/2/21
M3 - 专利
M1 - 202221934252.8
PB - China National Intellectual Property Administration
ER -