Translated title of the contribution | Thin film transistor device for improving radiation resistance by using hydrogen peroxide |
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Original language | Chinese (Simplified) |
Patent granted number | CN210866188U |
Validity date | 26/06/29 |
Publication status | Published - 26 Jun 2020 |
一种用双氧水提高抗辐射性的薄膜晶体管器件
Research output: Patent