Reliability Study of Dielectric Thin Film Transistor Devices Prepared by Solution Method

  • Zhao, Chun (PI)
  • Liu, Wen (Team member)
  • Zhao, Cezhou (Team member)
  • Zhou, Defan (Team member)
  • Liu, Qihan (Team member)
  • Zhao, Tianshi (Team member)
  • Fang, Yuxiao (Team member)
  • Shen, Zongjie (Team member)

Project: Governmental Research Project

Project Details

Project Title (In Chinese)


Fund Amount (RMB)

Project CategorySuzhou Science and Technology Development Planning Programme: Key Industrial Technology Innovation - Prospective Applied Basic Research Project
Effective start/end date1/07/1931/12/21


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