Well-shielded cerium atoms: Electronic structure of adsorbed Ce@C 82 on Si surfaces

K. Schulte; L. Wang; P. J. Moriarty; J. Purton; S. Patel; H. Shinohara; M. Kanai; T. J.S. Dennis

doi:10.1103/PhysRevB.71.115437

Well-shielded cerium atoms: Electronic structure of adsorbed Ce@C ₈₂ on Si surfaces

K. Schulte^*
, L. Wang
, P. J. Moriarty
, J. Purton
, S. Patel
, H. Shinohara
, M. Kanai
, T. J.S. Dennis

^*Corresponding author for this work

University of Nottingham
STFC Daresbury Laboratory
Nagoya University
King's College London

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

Abstract

The interaction of Ce@C ₈₂ with clean and silver-terminated Si(111) surfaces has been studied with synchrotron-radiation photoemission spectroscopy and near-edge x-ray absorption fine-structure (NEXAFS) spectroscopy. Use of an Ag/Si(111)-(√3×√3)R30° surface as an initial substrate enables the molecule-substrate interaction to be progressively strengthened through controlled annealing. Although strong covalent bonding and distortion of the fullerene cage are observed following the removal of the Ag-induced reconstruction (above 550°C), the cerium atom's valence and overall electronic structure, as probed by Ce 3d NEXAFS, appear to be remarkably unaffected.

Original language	English
Article number	115437
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	71
Issue number	11
DOIs	https://doi.org/10.1103/PhysRevB.71.115437
Publication status	Published - 15 Mar 2005
Externally published	Yes

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title = "Well-shielded cerium atoms: Electronic structure of adsorbed Ce@C 82 on Si surfaces",

abstract = "The interaction of Ce@C 82 with clean and silver-terminated Si(111) surfaces has been studied with synchrotron-radiation photoemission spectroscopy and near-edge x-ray absorption fine-structure (NEXAFS) spectroscopy. Use of an Ag/Si(111)-(√3×√3)R30° surface as an initial substrate enables the molecule-substrate interaction to be progressively strengthened through controlled annealing. Although strong covalent bonding and distortion of the fullerene cage are observed following the removal of the Ag-induced reconstruction (above 550°C), the cerium atom's valence and overall electronic structure, as probed by Ce 3d NEXAFS, appear to be remarkably unaffected.",

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T1 - Well-shielded cerium atoms

T2 - Electronic structure of adsorbed Ce@C 82 on Si surfaces

AU - Schulte, K.

AU - Wang, L.

AU - Moriarty, P. J.

AU - Purton, J.

AU - Patel, S.

AU - Shinohara, H.

AU - Kanai, M.

AU - Dennis, T. J.S.

PY - 2005/3/15

Y1 - 2005/3/15

N2 - The interaction of Ce@C 82 with clean and silver-terminated Si(111) surfaces has been studied with synchrotron-radiation photoemission spectroscopy and near-edge x-ray absorption fine-structure (NEXAFS) spectroscopy. Use of an Ag/Si(111)-(√3×√3)R30° surface as an initial substrate enables the molecule-substrate interaction to be progressively strengthened through controlled annealing. Although strong covalent bonding and distortion of the fullerene cage are observed following the removal of the Ag-induced reconstruction (above 550°C), the cerium atom's valence and overall electronic structure, as probed by Ce 3d NEXAFS, appear to be remarkably unaffected.

AB - The interaction of Ce@C 82 with clean and silver-terminated Si(111) surfaces has been studied with synchrotron-radiation photoemission spectroscopy and near-edge x-ray absorption fine-structure (NEXAFS) spectroscopy. Use of an Ag/Si(111)-(√3×√3)R30° surface as an initial substrate enables the molecule-substrate interaction to be progressively strengthened through controlled annealing. Although strong covalent bonding and distortion of the fullerene cage are observed following the removal of the Ag-induced reconstruction (above 550°C), the cerium atom's valence and overall electronic structure, as probed by Ce 3d NEXAFS, appear to be remarkably unaffected.

UR - https://www.scopus.com/pages/publications/20144361982

U2 - 10.1103/PhysRevB.71.115437

DO - 10.1103/PhysRevB.71.115437

M3 - Article

AN - SCOPUS:20144361982

SN - 1098-0121

VL - 71

JO - Physical Review B - Condensed Matter and Materials Physics

JF - Physical Review B - Condensed Matter and Materials Physics

IS - 11

M1 - 115437

ER -

Well-shielded cerium atoms: Electronic structure of adsorbed Ce@C ₈₂ on Si surfaces

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