Versailles Project on Advanced Materials and Standards Interlaboratory Study on Measuring the Thickness and Chemistry of Nanoparticle Coatings Using XPS and LEIS

Natalie A. Belsey, David J.H. Cant, Caterina Minelli, Joyce R. Araujo, Bernd Bock, Philipp Brüner, David G. Castner, Giacomo Ceccone, Jonathan D.P. Counsell, Paul M. Dietrich, Mark H. Engelhard, Sarah Fearn, Carlos E. Galhardo, Henryk Kalbe, Jeong Won Kim, Luis Lartundo-Rojas, Henry S. Luftman, Tim S. Nunney, Johannes Pseiner, Emily F. SmithValentina Spampinato, Jacobus M. Sturm, Andrew G. Thomas, Jon P.W. Treacy, Lothar Veith, Michael Wagstaffe, Hai Wang, Meiling Wang, Yung Chen Wang, Wolfgang Werner, Li Yang, Alexander G. Shard*

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

33 Citations (Scopus)

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