Two-wavelength phase-shifting method with four patterns for three-dimensional shape measurement

Jun Wu, Zihao Zhou, Qing Liu, Yajun Wang, Yuwei Wang, Yanhong Gu, Xiangcheng Chen*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

15 Citations (Scopus)


Fringe projection technique has been widely used for three-dimensional (3D) shape measurement. However, it remains challenging to achieve high-speed measurement. A two-wavelength phase-shifting profilometry method with only four patterns is presented. Specifically, all these four patterns contain two wavelength components. The short wavelength component was used to compute the wrapped phase map, while the long one was used to unwrap the wrapped phase map. The performance of the proposed method was validated by both simulation study and experimental results.

Original languageEnglish
Article number024107
JournalOptical Engineering
Issue number2
Publication statusPublished - 1 Feb 2020


  • 3D shape measurement
  • fringe projection
  • phase-shifting
  • two-wavelength

Cite this