Tiled and layer-adaptive three-dimensional structured illumination microscopy based on principal component analysis

Weiyi Xia; Jiaming Qian; Pengfei Fan; Chao Zuo

doi:10.1117/12.3019549

Tiled and layer-adaptive three-dimensional structured illumination microscopy based on principal component analysis

Weiyi Xia^*
, Jiaming Qian
, Pengfei Fan
, Chao Zuo

^*Corresponding author for this work

Nanjing University of Science and Technology
Jiangsu Key Laboratory of Spectral Imaging & Intelligent Sense

Research output: Chapter in Book or Report/Conference proceeding › Conference Proceeding › peer-review

Abstract

Three-dimensional (3D) Structured illumination microscopy (SIM) has become one of the most commonly implemented fluorescence super-resolution modes in life sciences due to its unique advantages of wide field of view, fast imaging, and weak phototoxicity and photobleaching. However, the traditional two-dimensional (2D) SIM suffers from the”missing cone” problem, which makes it impossible to realize true three-dimensional (3D) imaging. In order to solve this problem, 3D SIM has been developed to achieve twice the resolution in both lateral and axial directions. Recently, we propose a tiled and layer-adaptive 3D SIM based on principal component analysis (PCA) to solve the computational complexity and time-consuming, local perturbation of illumination parameters, and microscope moving mechanical errors faced by 3D SIM in parameter estimation. The algorithm accelerates and improves the accuracy of transverse and axial illumination parameters, which is expected to achieve fast, iteration-free, high-precision, high-quality 3D SIM super-resolution imaging.

Original language	English
Title of host publication	Sixth Conference on Frontiers in Optical Imaging and Technology
Subtitle of host publication	Novel Imaging Systems
Editors	Yan Zhou, Qiang Zhang, Feihu Xu, Bo Liu
Publisher	SPIE
ISBN (Electronic)	9781510679702
DOIs	https://doi.org/10.1117/12.3019549
Publication status	Published - 2024
Event	6th Conference on Frontiers in Optical Imaging and Technology: Novel Imaging Systems - Nanjing, China Duration: 22 Oct 2023 → 24 Oct 2023

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	13155
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	6th Conference on Frontiers in Optical Imaging and Technology: Novel Imaging Systems
Country/Territory	China
City	Nanjing
Period	22/10/23 → 24/10/23

Keywords

3D SIM
layer-adaptive
parameter estimation
principal component analysis
tiled reconstruction

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10.1117/12.3019549

Cite this

Xia, W., Qian, J., Fan, P., & Zuo, C. (2024). Tiled and layer-adaptive three-dimensional structured illumination microscopy based on principal component analysis. In Y. Zhou, Q. Zhang, F. Xu, & B. Liu (Eds.), Sixth Conference on Frontiers in Optical Imaging and Technology: Novel Imaging Systems Article 1315517 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 13155). SPIE. https://doi.org/10.1117/12.3019549

Xia, Weiyi ; Qian, Jiaming ; Fan, Pengfei et al. / Tiled and layer-adaptive three-dimensional structured illumination microscopy based on principal component analysis. Sixth Conference on Frontiers in Optical Imaging and Technology: Novel Imaging Systems. editor / Yan Zhou ; Qiang Zhang ; Feihu Xu ; Bo Liu. SPIE, 2024. (Proceedings of SPIE - The International Society for Optical Engineering).

@inproceedings{1e3c10406e9b470ab305172ea740eede,

title = "Tiled and layer-adaptive three-dimensional structured illumination microscopy based on principal component analysis",

abstract = "Three-dimensional (3D) Structured illumination microscopy (SIM) has become one of the most commonly implemented fluorescence super-resolution modes in life sciences due to its unique advantages of wide field of view, fast imaging, and weak phototoxicity and photobleaching. However, the traditional two-dimensional (2D) SIM suffers from the{\textquotedblright}missing cone{\textquotedblright} problem, which makes it impossible to realize true three-dimensional (3D) imaging. In order to solve this problem, 3D SIM has been developed to achieve twice the resolution in both lateral and axial directions. Recently, we propose a tiled and layer-adaptive 3D SIM based on principal component analysis (PCA) to solve the computational complexity and time-consuming, local perturbation of illumination parameters, and microscope moving mechanical errors faced by 3D SIM in parameter estimation. The algorithm accelerates and improves the accuracy of transverse and axial illumination parameters, which is expected to achieve fast, iteration-free, high-precision, high-quality 3D SIM super-resolution imaging.",

keywords = "3D SIM, layer-adaptive, parameter estimation, principal component analysis, tiled reconstruction",

author = "Weiyi Xia and Jiaming Qian and Pengfei Fan and Chao Zuo",

note = "Publisher Copyright: {\textcopyright} 2024 SPIE.; 6th Conference on Frontiers in Optical Imaging and Technology: Novel Imaging Systems ; Conference date: 22-10-2023 Through 24-10-2023",

year = "2024",

doi = "10.1117/12.3019549",

language = "English",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "SPIE",

editor = "Yan Zhou and Qiang Zhang and Feihu Xu and Bo Liu",

booktitle = "Sixth Conference on Frontiers in Optical Imaging and Technology",

}

Xia, W, Qian, J, Fan, P & Zuo, C 2024, Tiled and layer-adaptive three-dimensional structured illumination microscopy based on principal component analysis. in Y Zhou, Q Zhang, F Xu & B Liu (eds), Sixth Conference on Frontiers in Optical Imaging and Technology: Novel Imaging Systems., 1315517, Proceedings of SPIE - The International Society for Optical Engineering, vol. 13155, SPIE, 6th Conference on Frontiers in Optical Imaging and Technology: Novel Imaging Systems, Nanjing, China, 22/10/23. https://doi.org/10.1117/12.3019549

Tiled and layer-adaptive three-dimensional structured illumination microscopy based on principal component analysis. / Xia, Weiyi; Qian, Jiaming; Fan, Pengfei et al.
Sixth Conference on Frontiers in Optical Imaging and Technology: Novel Imaging Systems. ed. / Yan Zhou; Qiang Zhang; Feihu Xu; Bo Liu. SPIE, 2024. 1315517 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 13155).

Research output: Chapter in Book or Report/Conference proceeding › Conference Proceeding › peer-review

TY - GEN

T1 - Tiled and layer-adaptive three-dimensional structured illumination microscopy based on principal component analysis

AU - Xia, Weiyi

AU - Qian, Jiaming

AU - Fan, Pengfei

AU - Zuo, Chao

PY - 2024

Y1 - 2024

N2 - Three-dimensional (3D) Structured illumination microscopy (SIM) has become one of the most commonly implemented fluorescence super-resolution modes in life sciences due to its unique advantages of wide field of view, fast imaging, and weak phototoxicity and photobleaching. However, the traditional two-dimensional (2D) SIM suffers from the”missing cone” problem, which makes it impossible to realize true three-dimensional (3D) imaging. In order to solve this problem, 3D SIM has been developed to achieve twice the resolution in both lateral and axial directions. Recently, we propose a tiled and layer-adaptive 3D SIM based on principal component analysis (PCA) to solve the computational complexity and time-consuming, local perturbation of illumination parameters, and microscope moving mechanical errors faced by 3D SIM in parameter estimation. The algorithm accelerates and improves the accuracy of transverse and axial illumination parameters, which is expected to achieve fast, iteration-free, high-precision, high-quality 3D SIM super-resolution imaging.

AB - Three-dimensional (3D) Structured illumination microscopy (SIM) has become one of the most commonly implemented fluorescence super-resolution modes in life sciences due to its unique advantages of wide field of view, fast imaging, and weak phototoxicity and photobleaching. However, the traditional two-dimensional (2D) SIM suffers from the”missing cone” problem, which makes it impossible to realize true three-dimensional (3D) imaging. In order to solve this problem, 3D SIM has been developed to achieve twice the resolution in both lateral and axial directions. Recently, we propose a tiled and layer-adaptive 3D SIM based on principal component analysis (PCA) to solve the computational complexity and time-consuming, local perturbation of illumination parameters, and microscope moving mechanical errors faced by 3D SIM in parameter estimation. The algorithm accelerates and improves the accuracy of transverse and axial illumination parameters, which is expected to achieve fast, iteration-free, high-precision, high-quality 3D SIM super-resolution imaging.

KW - 3D SIM

KW - layer-adaptive

KW - parameter estimation

KW - principal component analysis

KW - tiled reconstruction

UR - https://www.scopus.com/pages/publications/85192970969

U2 - 10.1117/12.3019549

DO - 10.1117/12.3019549

M3 - Conference Proceeding

AN - SCOPUS:85192970969

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Sixth Conference on Frontiers in Optical Imaging and Technology

A2 - Zhou, Yan

A2 - Zhang, Qiang

A2 - Xu, Feihu

A2 - Liu, Bo

PB - SPIE

T2 - 6th Conference on Frontiers in Optical Imaging and Technology: Novel Imaging Systems

Y2 - 22 October 2023 through 24 October 2023

ER -

Xia W, Qian J, Fan P, Zuo C. Tiled and layer-adaptive three-dimensional structured illumination microscopy based on principal component analysis. In Zhou Y, Zhang Q, Xu F, Liu B, editors, Sixth Conference on Frontiers in Optical Imaging and Technology: Novel Imaging Systems. SPIE. 2024. 1315517. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.3019549

Tiled and layer-adaptive three-dimensional structured illumination microscopy based on principal component analysis

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