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Threshold Voltage Instability in D-mode AlGaN/GaN MIS-HEMTs with Al2O3 Gate Dielectric
Ye Liang, Yuanlei Zhang, Yutao Cai, Zhaoyi Wang, Yinchao Zhao, Huiqing Wen, Wen Liu
Research output: Chapter in Book or Report/Conference proceeding › Conference Proceeding › peer-review
3
Citations
(Scopus)