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The refractive nonlinearities of InAs/GaAs quantum dots above-bandgap energy

  • X. Huang
  • , X. H. Zhang*
  • , Y. G. Zhu
  • , T. Li
  • , L. F. Han
  • , X. J. Shang
  • , H. Q. Ni
  • , Z. C. Niu
  • *Corresponding author for this work
  • CAS - Institute of Semiconductors

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

The third-order optical nonlinear refractive properties of InAs/GaAs quantum dots grown by molecular beam epitaxy have been measured using the reflection Z-scan technique at above-bandgap energy. The nonlinear refractive index and nonlinear absorption index of the InAs/GaAs quantum dots were determined for wavelengths from 740 to 777 nm. The measured results are compared with the nonlinear refractive response of several typical III-V group semiconductor materials. The corresponding mechanisms responsible for the large nonlinear response are discussed.

Original languageEnglish
Pages (from-to)1510-1513
Number of pages4
JournalOptics Communications
Volume283
Issue number7
DOIs
Publication statusPublished - 1 Apr 2010
Externally publishedYes

Keywords

  • InAs quantum dots
  • Nonlinear refraction
  • Reflection Z-scan

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