The fault detection, localization, and tolerant operation of modular multilevel converters with an Insulated Gate Bipolar Transistor (IGBT) open circuit fault
Wei Li, Gengyin Li, Rong Zeng, Kai Ni*, Yihua Hu, Huiqing Wen
Research output: Contribution to journal › Article › peer-review
13Citations
(Scopus)
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