Abstract
The relationship between strain and growth conditions in LaCoO3 thin film was obtained to control the magnetic-electric characteristics. The LaCoO3 thin films on the SrTiO3 substrates have been achieved by the pulsed laser deposition method, and the reflection high-energy electron diffraction method (RHEED) was applied to monitor the growth process in situ; the layer-by-layer growth mode was discovered. The X-ray diffraction and atomic force microscopy were applied to the phase analysis, and the layer thickness and the layer-by-layer growth mode were uncovered. Compared with the 100-nm LaCoO3 thin films, the strain in the layer-by-layer ultra thin film was more controllable. The enhanced magnetic properties of the layer-by-layer mode ultra-thin films could be tested in future work.
| Original language | English |
|---|---|
| Pages (from-to) | 1160-1164 |
| Number of pages | 5 |
| Journal | Surface and Interface Analysis |
| Volume | 49 |
| Issue number | 11 |
| DOIs | |
| Publication status | Published - Nov 2017 |
| Externally published | Yes |
Keywords
- LaCoO thin films
- layer-by-layer growth
- pulsed laser deposition
- RHEED