Fingerprint
Dive into the research topics of 'TCAD Simulation Analysis on Gate Structure and Trap Effect of GaN-Based Junctionless FinFETs'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
TCAD Simulation Analysis on Gate Structure and Trap Effect of GaN-Based Junctionless FinFETs
Yizhou Jiang*, Zifeng Qu, Yichi Zhang, Tianran Liu, Huiqing Wen
*Corresponding author for this work
Research output: Chapter in Book or Report/Conference proceeding › Conference Proceeding › peer-review