@inproceedings{4c4de5de06f54d7d858c8815f8a82e56,
title = "Synaptic transistors based on transparent oxide for neural image recognition",
abstract = "Artificial synaptic devices are the critical component for large-scale neuromorphic computing, which surpasses the limitations of von Neumann's structure. Recently the emerging electrolytic gated transistor (EGT) has proven to be a promising neuromorphic application due to the conductance can be updated by the gate voltage stimulation. This paper presents a new low-temperature solution-based oxide thin film transistor, which uses an ion-doped dielectric layer. The suitable ion doping concentration is obtained by the synaptic electrical characteristic. The synaptic transistor also has a low-noise linear conductance update and a relatively high Gmax/Gmin ratio.",
keywords = "MNIST, image recognition, neural computing, solution-processed transistor, synaptic device",
author = "Wang, \{Q. N.\} and C. Zhao and W. Liu and Mitrovic, \{I. Z.\} and \{Van Zalinge\}, H. and Liu, \{Y. N.\} and Zhao, \{C. Z.\}",
note = "Funding Information: Figure 4. (a) The increasing and decreasing of channel conductance illustrating the long-term potentiation and long-term depression. (b) The long-term potentiation and Natural forgetting process ACKNOWLEDGMENT This research was funded in part by the Natural Science Foundation of the Jiangsu Higher Education Institutions of China Program (19KJB510059), Natural Science Foundation of Jiangsu Province of China (BK20180242), the Suzhou Science and Technology Development Planning Project: Key Industrial Technology Innovation (SYG201924), University Research Development Fund (RDF-17-01-13), and the Key Program Special Fund in XJTLU (KSF-P-02, KSF-T-03, KSF-A-04, KSF-A-05, KSF-A-07, KSF-A-18). Publisher Copyright: {\textcopyright} 2021 IEEE.; 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EuroSOI-ULIS 2021 ; Conference date: 01-09-2021 Through 03-09-2021",
year = "2021",
month = sep,
day = "1",
doi = "10.1109/EuroSOI-ULIS53016.2021.9560177",
language = "English",
series = "2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EuroSOI-ULIS 2021",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EuroSOI-ULIS 2021",
}