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Dive into the research topics of 'Study of Drain-current Collapse in AlGaN/GaN MIS-HEMTs with Different Gate Lengths'. Together they form a unique fingerprint.- Sort by
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Ye Liang, Yuanlei Zhang, Xiuyuan He, Yinchao Zhao, Miao Cui, Huiqing Wen, Wen Liu*
Research output: Chapter in Book or Report/Conference proceeding › Conference Proceeding › peer-review