Study of Drain-current Collapse in AlGaN/GaN MIS-HEMTs with Different Gate Lengths

Ye Liang, Yuanlei Zhang, Xiuyuan He, Yinchao Zhao, Miao Cui, Huiqing Wen, Wen Liu*

*Corresponding author for this work

Research output: Chapter in Book or Report/Conference proceedingConference Proceedingpeer-review

1 Citation (Scopus)

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