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Reliability does matter: An end-to-end weakly supervised semantic segmentation approach

  • Bingfeng Zhang
  • , Jimin Xiao*
  • , Yunchao Wei
  • , Mingjie Sun
  • , Kaizhu Huang
  • *Corresponding author for this work
    • Xi'an Jiaotong-Liverpool University
    • University of Technology Sydney

    Research output: Chapter in Book or Report/Conference proceeding › Conference Proceeding › peer-review

    216 Citations (Scopus)

    Abstract

    Weakly supervised semantic segmentation is a challenging task as it only takes image-level information as supervision for training but produces pixel-level predictions for testing. To address such a challenging task, most recent state-of-the-art approaches propose to adopt two-step solutions, i.e. 1) learn to generate pseudo pixel-level masks, and 2) engage FCNs to train the semantic segmentation networks with the pseudo masks. However, the two-step solutions usually employ many bells and whistles in producing high-quality pseudo masks, making this kind of methods complicated and inelegant. In this work, we harness the image-level labels to produce reliable pixel-level annotations and design a fully end-to-end network to learn to predict segmentation maps. Concretely, we firstly leverage an image classification branch to generate class activation maps for the annotated categories, which are further pruned into confident yet tiny object/background regions. Such reliable regions are then directly served as ground-truth labels for the parallel segmentation branch, where a newly designed dense energy loss function is adopted for optimization. Despite its apparent simplicity, our one-step solution achieves competitive mIoU scores (val: 62.6, test: 62.9) on Pascal VOC compared with those two-step state-of-the-arts. By extending our one-step method to two-step, we get a new state-of-the-art performance on the Pascal VOC (val: 66.3, test: 66.5).

    Original languageEnglish
    Title of host publicationAAAI 2020 - 34th AAAI Conference on Artificial Intelligence
    PublisherAAAI press
    Pages12765-12772
    Number of pages8
    ISBN (Electronic)9781577358350
    Publication statusPublished - 2020
    Event34th AAAI Conference on Artificial Intelligence, AAAI 2020 - New York, United States
    Duration: 7 Feb 2020 → 12 Feb 2020

    Publication series

    NameAAAI 2020 - 34th AAAI Conference on Artificial Intelligence

    Conference

    Conference34th AAAI Conference on Artificial Intelligence, AAAI 2020
    Country/TerritoryUnited States
    CityNew York
    Period7/02/20 → 12/02/20

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