| Original language | English |
|---|---|
| Journal | IEEE Transactions on Reliability |
| Publication status | Published - Dec 2024 |
Reliability Analysis of Cyclic Accelerated Life Test Data Using Log-Location-Scale Family of Distributions Under Censoring With Application to Solder Joint Data
- Wenhan Zhang
- , Xiaojun Zhu*
- , Mu He
- , Narayanaswamy Balakrishnan
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
2
Citations
(Scopus)