Real-time and on-site γ-ray radiation response testing system for semiconductor devices and its applications

Yifei Mu*, Ce Zhou Zhao, Yanfei Qi, Sang Lam, Chun Zhao, Qifeng Lu, Yutao Cai, Ivona Z. Mitrovic, Stephen Taylor, Paul R. Chalker

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

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