Morphology, structure, and electronic properties of Ce@C82 films on Ag:Si(1 1 1)-(√3×3)R30°
L. Wang, K. Schulte, R. A.J. Woolley, M. Kanai, T. J.S. Dennis, J. Purton, S. Patel, S. Gorovikov, V. R. Dhanak, E. F. Smith, B. C.C. Cowie, P. Moriarty*
Research output: Contribution to journal › Article › peer-review
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