LLMarking: Adaptive Automatic Short-Answer Grading Using Large Language Models

  • Hanling Wang
  • , Banghao Chi
  • , Yufei Wu
  • , Kexin Chen
  • , Di Wu
  • , Songning Liu
  • , Yiwei Li
  • , Hanyan Niu
  • , Xiaohui Zhu*
  • *Corresponding author for this work

Research output: Chapter in Book or Report/Conference proceedingConference Proceedingpeer-review

Abstract

With the advancement of educational technology, automatic assessment systems are becoming increasingly essential, particularly for grading short-answer questions. However, due to the inherent ambiguity and complexity of language, automatic grading of short-answer questions remains a challenge. Traditional grading methods are often time-consuming and subjective, highlighting the need for efficient, objective, and feedback-driven solutions. This paper proposes an innovative approach to automatic short answer grading (ASAG) utilizing large language models (LLMs). We introduce a specialized design for crafting questions and corresponding answers named Key Point Scoring Framework (KPSF) which significantly enhances the model's performance in ASAG tasks and improves the flexibility and objectivity of assessments. Moreover, we incorporate Prompt Dynamic Adjustment (PDA) that continuously refines the grading process, effectively handling ambiguous student responses while ensuring reliable results. To evaluate our approach, we develop a multidisciplinary dataset and incorporate real-world dataset from actual exams. The experimental results demonstrate that our ASAG approach provides educators with a highly efficient, flexible and accurate tool for short-answer assessments, indicating a significant advancement in automatic grading technology.

Original languageEnglish
Title of host publicationL@S 2025 - Proceedings of the 12th ACM Conference on Learning @ Scale
PublisherAssociation for Computing Machinery, Inc
Pages105-115
Number of pages11
ISBN (Electronic)9798400712913
DOIs
Publication statusPublished - 17 Jul 2025
Event12th ACM Conference on Learning @ Scale, L@S 2025 - Palermo, Italy
Duration: 21 Jul 202523 Jul 2025

Publication series

NameL@S 2025 - Proceedings of the 12th ACM Conference on Learning @ Scale

Conference

Conference12th ACM Conference on Learning @ Scale, L@S 2025
Country/TerritoryItaly
CityPalermo
Period21/07/2523/07/25

Keywords

  • automatic grading
  • key point scoring
  • large language models
  • natural language processing
  • prompt engineering

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