TY - GEN
T1 - LENS-DF
T2 - 2025 IEEE International Joint Conference on Biometrics, IJCB 2025
AU - Liu, Xuechen
AU - Ge, Wanying
AU - Wang, Xin
AU - Yamagishi, Junichi
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - This study introduces LENS-DF, a novel and comprehensive recipe for training and evaluating audio deepfake detection and temporal localization under complicated and realistic audio conditions. The generation part of the recipe outputs audios from the input dataset with several critical characteristics, such as longer duration, noisy conditions, and containing multiple speakers, in a controllable fashion. The corresponding detection and localization protocol uses models. We conduct experiments based on self-supervised learning front-end and simple back-end. The results indicate that models trained using data generated with LENS-DF consistently outperform those trained via conventional recipes, demonstrating the effectiveness and usefulness of LENS-DF for robust audio deepfake detection and localization.
AB - This study introduces LENS-DF, a novel and comprehensive recipe for training and evaluating audio deepfake detection and temporal localization under complicated and realistic audio conditions. The generation part of the recipe outputs audios from the input dataset with several critical characteristics, such as longer duration, noisy conditions, and containing multiple speakers, in a controllable fashion. The corresponding detection and localization protocol uses models. We conduct experiments based on self-supervised learning front-end and simple back-end. The results indicate that models trained using data generated with LENS-DF consistently outperform those trained via conventional recipes, demonstrating the effectiveness and usefulness of LENS-DF for robust audio deepfake detection and localization.
UR - https://www.scopus.com/pages/publications/105035830154
U2 - 10.1109/IJCB65343.2025.11411544
DO - 10.1109/IJCB65343.2025.11411544
M3 - Conference Proceeding
AN - SCOPUS:105035830154
T3 - 2025 IEEE International Joint Conference on Biometrics, IJCB 2025
BT - 2025 IEEE International Joint Conference on Biometrics, IJCB 2025
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 8 September 2025 through 11 September 2025
ER -