TY - JOUR
T1 - Just-in-time framework for robust soft sensing based on robust variational autoencoder
AU - Guo, Fan
AU - Liu, Kun
AU - Huang, Biao
N1 - Publisher Copyright:
© 2024
PY - 2024/11
Y1 - 2024/11
N2 - Modeling with high-dimensional data subject to abnormal observations have always been a practical interest. In this paper, under the just-in-time learning (JITL) framework, a robust soft sensor modeling approach is developed based on robust Variational Autoencoder (VAE). Unlike the vanilla VAE that extracts features from the given dataset under the Gaussian prior assumption, robust VAE employs Student's t-distribution as prior distribution to handle abnormal data. Under assumption of the Student's t-prior, the proposed robust VAE model is capable of describing collected data contaminated with outliers. Once the robust VAE model is trained, each robust feature variable in the latent space can be determined. Subsequently, similarity measure is calculated using robust Kullback-Leibler divergence between two Student's t-distributions, that is, the distribution of a new data sample and that of each historical data sample. After completing similarity measurement for a query sample, the weights for input-output historical data can be determined. Based on these weighted historical data samples, a robust probabilistic principal component regression (PPCR) is utilized to perform local modeling for prediction. Numerical simulations, including the Tennessee Eastman and Penicillin fermentation benchmark processes, are utilized to validate the proposed JITL-based robust soft sensor modeling method.
AB - Modeling with high-dimensional data subject to abnormal observations have always been a practical interest. In this paper, under the just-in-time learning (JITL) framework, a robust soft sensor modeling approach is developed based on robust Variational Autoencoder (VAE). Unlike the vanilla VAE that extracts features from the given dataset under the Gaussian prior assumption, robust VAE employs Student's t-distribution as prior distribution to handle abnormal data. Under assumption of the Student's t-prior, the proposed robust VAE model is capable of describing collected data contaminated with outliers. Once the robust VAE model is trained, each robust feature variable in the latent space can be determined. Subsequently, similarity measure is calculated using robust Kullback-Leibler divergence between two Student's t-distributions, that is, the distribution of a new data sample and that of each historical data sample. After completing similarity measurement for a query sample, the weights for input-output historical data can be determined. Based on these weighted historical data samples, a robust probabilistic principal component regression (PPCR) is utilized to perform local modeling for prediction. Numerical simulations, including the Tennessee Eastman and Penicillin fermentation benchmark processes, are utilized to validate the proposed JITL-based robust soft sensor modeling method.
KW - Just-in-time learning
KW - Robust Kullback-Leibler divergence
KW - Robust PPCR
KW - VAE with Student's t-prior
UR - https://www.scopus.com/pages/publications/85206878999
U2 - 10.1016/j.jprocont.2024.103325
DO - 10.1016/j.jprocont.2024.103325
M3 - Article
AN - SCOPUS:85206878999
SN - 0959-1524
VL - 143
JO - Journal of Process Control
JF - Journal of Process Control
M1 - 103325
ER -