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Junction Temperature Extraction for Silicon Carbide Power Devices: A Comprehensive Review
Huiqing Wen*, Xiaoyu Li, Fei Zhang, Zifeng Qu, Yizhou Jiang, Ningyu Luo, Guangyu Wang, Xue Wang, Wen Liu, Miao Cui, Yinchao Zhao
*Corresponding author for this work
Research output: Contribution to journal › Review article › peer-review