Investigation of normally-OFF AlGaN/GaN MIS-HEMTs with Al2O3/ZrOx/Al2O3charge trapping layer

Jiachen Duan, Yuanlei Zhang, Ye Liang, Yutao Cai, Wen Liu

Research output: Chapter in Book or Report/Conference proceeding › Conference Proceeding › peer-review

3 Citations (Scopus)
Plum Print visual indicator of research metrics
  • Citations
    • Citation Indexes: 3
see details

Fingerprint

Dive into the research topics of 'Investigation of normally-OFF AlGaN/GaN MIS-HEMTs with Al2O3/ZrOx/Al2O3charge trapping layer'. Together they form a unique fingerprint.

Physics

Material Science

Computer Science