Investigation of anomalous capacitance-voltage behavior caused by interface dipoles and the effect of post-metal-annealing

Qifeng Lu, Ce Zhou Zhao*, Chun Zhao, Steve Taylor, Paul R. Chalker

*Corresponding author for this work

Research output: Chapter in Book or Report/Conference proceeding › Conference Proceeding › peer-review

Fingerprint

Dive into the research topics of 'Investigation of anomalous capacitance-voltage behavior caused by interface dipoles and the effect of post-metal-annealing'. Together they form a unique fingerprint.