FastRecon: Few-shot Industrial Anomaly Detection via Fast Feature Reconstruction

Zheng Fang, Xiaoyang Wang, Haocheng Li, Jiejie Liu, Qiugui Hu, Jimin Xiao*

*Corresponding author for this work

Research output: Chapter in Book or Report/Conference proceedingConference Proceedingpeer-review

7 Citations (Scopus)

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Computer Science