Extrinsic and Intrinsic Frequency Dispersion of High-k Materials in Capacitance-Voltage Measurements

J. Tao, C. Z. Zhao*, C. Zhao, P. Taechakumput, M. Werner, S. Taylor, P. R. Chalker

*Corresponding author for this work

Research output: Contribution to journal › Review article › peer-review

66 Citations (Scopus)

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