Effects of biased irradiation on charge trapping in HfO2 dielectric thin films

Yifei Mu, Ce Zhou Zhao*, Qifeng Lu, Chun Zhao, Yanfei Qi, Sang Lam, Ivona Z. Mitrovic, Stephen Taylor, Paul R. Chalker

*Corresponding author for this work

Research output: Chapter in Book or Report/Conference proceeding › Conference Proceeding › peer-review

5 Citations (Scopus)

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