Effect of surface treatment on electrical properties of GaN metal-insulator-semiconductor devices with Al2O3 gate dielectric

Yutao Cai, Wen Liu, Miao Cui, Ruize Sun, Yung C. Liang, Huiqing Wen, Li Yang, Siti N. Supardan, Ivona Z. Mitrovic, Stephen Taylor, Paul R. Chalker, Cezhou Zhao*

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

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