Effect of annealing temperature for Ni/AlOx/Pt RRAM devices fabricated with solution-based dielectric

Zongjie Shen, Yanfei Qi, Ivona Z. Mitrovic, Cezhou Zhao*, Steve Hall, Li Yang, Tian Luo, Yanbo Huang, Chun Zhao*

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

35 Citations (Scopus)

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