Dynamic Performance Analysis of Ultra-fast Inverter based on Tri-gate AlGaN/GaN MIS-HEMTs

Yunsong Xu, Weisheng Wang, Dechang Quan, Haotian Ji, Shenlei Ding, Yunzhou Jiang, Kain Lu Low, Jiangmin Gu*, Wen Liu

*Corresponding author for this work

Research output: Chapter in Book or Report/Conference proceedingConference Proceedingpeer-review

Abstract

This work demonstrates dynamic response characteristics of the tri-gate AlGaN/GaN high electron mobility transistor (HEMT) direct coupled FET logic (DCFL) inverter. The threshold voltage of the inverter is 2.74 V, the rise and fall time are 2.6 ns and 2.0 ns respectively with 1.8 ns and 0.2 ns propagation delay for each edge. The mechanisms for the excellent switching time performance are also revealed from the perspective of the device.

Original languageEnglish
Title of host publication9th IEEE Electron Devices Technology and Manufacturing Conference
Subtitle of host publicationShaping the Future with Innovations in Devices and Manufacturing, EDTM 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798331504168
DOIs
Publication statusPublished - 2025
Event9th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2025 - Hong Kong, Hong Kong
Duration: 9 Mar 202512 Mar 2025

Publication series

Name9th IEEE Electron Devices Technology and Manufacturing Conference: Shaping the Future with Innovations in Devices and Manufacturing, EDTM 2025

Conference

Conference9th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2025
Country/TerritoryHong Kong
CityHong Kong
Period9/03/2512/03/25

Keywords

  • GaN
  • Logic circuit
  • Monolithic integration
  • Tri-gate MIS-HEMT

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