Abstract
This article presents the Emerging Semiconductor Device Electrical Dataset (ESDED), a comprehensive collection of I-V characteristics data extracted from advanced CMOS devices. The ESDED dataset covers a range of device types, bias voltages, physical dimensions, and multiple process technologies. In this work, we meticulously document the design methodology used to create the dataset and provide a comprehensive overview of its format and accessibility. ESDED is designed to function as a standardized benchmark for evaluating and comparing emerging semiconductor models. It provides semiconductor researchers and model developers with a rich and extensive dataset, thereby facilitating the acquisition of sufficient data for compact models.
| Original language | English |
|---|---|
| Pages (from-to) | 132-139 |
| Number of pages | 8 |
| Journal | IEEE Data Descriptions |
| Volume | 3 |
| DOIs | |
| Publication status | Published - 12 Feb 2026 |
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