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Descriptor: Emerging Semiconductor Device Electrical Dataset (ESDED)

  • Feiyang Shen
  • , Ruoyu Tang
  • , Qing Zhang
  • , Chao Wang
  • , Yuhang Zhang
  • , Kain Lu Low*
  • , Yongfu Li*
  • *Corresponding author for this work
  • School of Integrated Circuits, Shanghai Jiao Tong University, Shanghai, China

Research output: Contribution to journalArticlepeer-review

Abstract

This article presents the Emerging Semiconductor Device Electrical Dataset (ESDED), a comprehensive collection of I-V characteristics data extracted from advanced CMOS devices. The ESDED dataset covers a range of device types, bias voltages, physical dimensions, and multiple process technologies. In this work, we meticulously document the design methodology used to create the dataset and provide a comprehensive overview of its format and accessibility. ESDED is designed to function as a standardized benchmark for evaluating and comparing emerging semiconductor models. It provides semiconductor researchers and model developers with a rich and extensive dataset, thereby facilitating the acquisition of sufficient data for compact models.
Original languageEnglish
Pages (from-to)132-139
Number of pages8
JournalIEEE Data Descriptions
Volume3
DOIs
Publication statusPublished - 12 Feb 2026

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