Comprehensive thermal characterization using ruby R fluorescence lines of sapphire and GaNE2-high Raman mode from Raman spectra in high-power flip-chip InGaN/GaN LEDs

M. Cui*, T. F. Zhou, M. R. Wang, J. Huang, H. J. Huang, J. P. Zhang, K. Xu, H. Yang

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

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