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Characterization of Oxide Trapping in SiC MOSFETs Under Positive Gate Bias
Ye Liang, Yuanlei Zhang, Jingqun Zhang, Xiuyuan He, Yinchao Zhao, Miao Cui, Huiqing Wen, Mingxiang Wang*, Wen Liu*
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
4
Citations
(Scopus)