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Characteristics of RF power amplifiers by 0.5μm SOS CMOS process

  • S. Lam*
  • , W. H. Ki
  • , M. Chan
  • *Corresponding author for this work
  • Hong Kong University of Science and Technology

Research output: Contribution to conferencePaperpeer-review

2 Citations (Scopus)

Abstract

The properties of radio frequency (RF) power amplifier constructed by SOS MOSFET was investigated. The first characterization of RF power amplifier without body contact from a 0.5 μm SOS CMOS process was reported. The measured power gain at 1 GHz was 10.5 dBm and the power added efficiency (PAE) was 40%. The floating body effect resulted in a soft breakdown that leaded to a drop in the PAE.

Original languageEnglish
Pages141-142
Number of pages2
Publication statusPublished - 2001
Externally publishedYes
Event2001 IEEE International SOI Conference - Durango, CO, United States
Duration: 1 Oct 20014 Oct 2001

Conference

Conference2001 IEEE International SOI Conference
Country/TerritoryUnited States
CityDurango, CO
Period1/10/014/10/01

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