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Analysis of deep level defects in bipolar junction transistors irradiated by 2 MeV electrons
Yao Ma, Pengfei Xu, Mingyue Guan, Filippo Boi, Gao Bo*, Min Gong, Xue Wu, Yuxin Wang, Hua Wang, Zeng Qiang Niao
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review