An automatic method for extracting and classifying defect in optical photomask images

Youngmin Ha*, Hong Jeong

*Corresponding author for this work

Research output: Chapter in Book or Report/Conference proceedingConference Proceedingpeer-review

6 Citations (Scopus)

Fingerprint

Dive into the research topics of 'An automatic method for extracting and classifying defect in optical photomask images'. Together they form a unique fingerprint.

Physics

Biochemistry, Genetics and Molecular Biology