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Accelerated Degradation Tests Planning with Competing Failure Modes
Xiujie Zhao
*
,
Jianyu Xu
, Bin Liu
*
Corresponding author for this work
City University of Hong Kong
University of Chinese Academy of Sciences
Research output
:
Contribution to journal
›
Article
›
peer-review
39
Citations (Scopus)
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Mathematics
Failure Mode
100%
Probability Theory
50%
Parameters
50%
Number
50%
Numerical Method
50%
Numerical Example
50%
Reliability Assessment
50%
Optimality
50%
Sensitivity Analysis
50%
Stress Level
50%
Arrival Process
50%
Test Unit
50%
Equivalence Theorem
50%
Wiener Process
50%
Nonhomogeneous Poisson Process
50%
Optimality Criterion
50%
Degradation Rate
50%
Fisher Information
50%
Engineering
Planning
100%
Test Plan
100%
Failure Mode
100%
Products
50%
Failure (Mechanical)
33%
Optimality
33%
Models
16%
Illustrates
16%
Measurement
16%
Reliability
16%
Numerical Example
16%
Reliability Assessment
16%
Numerical Method
16%
Optimization Approach
16%
Degradation Rate
16%
Wiener-Shannon Equation
16%
Fisher Information
16%
Test Duration
16%
Stress Level
16%
Test Unit
16%
Arrival Process
16%
Poisson Process
16%
Computer Science
Brownian Motion
100%
Models
50%
Sensitivity Analysis
50%
Probability
50%
Numerical Analysis
50%
Numerical Example
50%
Fisher Information
50%
Arrival Process
50%
Global Optimality
50%
Economics, Econometrics and Finance
Levy Process
100%
Sensitivity Analysis
50%
Information
50%
Robustness
50%
Numerical Methods
50%