A nonlinear model to assess DC/AC performance reliability of submicron SiC MESFETs

S. Rehman, M. M. Ahmed*, U. Rafique, M. N. Khan

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Fingerprint

Dive into the research topics of 'A nonlinear model to assess DC/AC performance reliability of submicron SiC MESFETs'. Together they form a unique fingerprint.

Material Science

Engineering