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脉冲I-V与脉冲C-V半导体参数自动测量装置和方法

Translated title of the contribution: Device and method for automatically measuring pulse current-voltage (I-V) and pulse capacitance-voltage (C-V) semiconductor parameters
  • Xiaomang Wei (Inventor)
  • , Cezhou Zhao (Inventor)
  • , Yunlong Zhou (Inventor)
    • NA

    Research output: Patent

    Translated title of the contributionDevice and method for automatically measuring pulse current-voltage (I-V) and pulse capacitance-voltage (C-V) semiconductor parameters
    Original languageChinese (Simplified)
    Patent granted numberCN102116827B
    Validity date23/12/30
    Publication statusPublished - 20 Mar 2013

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