可用于X射线,γ射线辐射实验的多功能探针台测试系统

Translated title of the contribution: Multifunctional probe bench test system used for radiation experiment of X-ray and gamma-ray
  • Jingkang Gui (Inventor)
  • , Cezhou Zhao (Inventor)
  • , Xinli Hu (Inventor)

Research output: Patent

Translated title of the contributionMultifunctional probe bench test system used for radiation experiment of X-ray and gamma-ray
Original languageChinese (Simplified)
Patent granted numberCN102226832B
Validity date31/03/31
Publication statusPublished - 27 Nov 2013

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