| Original language | Chinese (Simplified) |
|---|---|
| Patent granted number | CN116580267B |
| Publication status | Published - 29 Jul 2025 |
| Externally published | Yes |
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一种缺陷样本的生成方法、装置、电子设备及存储介质
- Kaizhu Huang (Inventor)
- , Chaolong Yang (Inventor)
- , Guanyu Yang (Inventor)
- , Weiguang Zhao (Inventor)
Research output: Patent