| Original language | Chinese (Simplified) |
|---|---|
| IPC | 202411225197.9 |
| Publication status | Published - 27 Dec 2024 |
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一种晶格性能评估预测系统的形成方法及使用方法
- Min Chen (Inventor)
- , Fuyuan Liu (Inventor)
- , Zhouyi Xiang (Inventor)
- , Pengfei Song (Inventor)
- , Eng Gee Lim (Inventor)
Research output: Patent