| Translated title of the contribution | A semiconductor detection circuit |
|---|---|
| Original language | Chinese (Simplified) |
| Patent granted number | CN219842511U |
| Validity date | 22/05/33 |
| Publication status | Published - 17 Oct 2023 |
一种半导体检测电路
Yukai Lei (Inventor), Huiqing Wen (Inventor)
Research output: Patent