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一种半导体器件瞬态电容的测试系统

Translated title of the contribution: Test system of semiconductor device transient capacitance
  • Jingjin Wu (Inventor)
  • , Cezhou Zhao (Inventor)
  • , Chenguang Liu (Inventor)

Research output: Patent

Translated title of the contributionTest system of semiconductor device transient capacitance
Original languageChinese (Simplified)
Patent granted numberCN204575748U
Validity date27/03/25
Publication statusPublished - 19 Aug 2015

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