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一种半导体器件γ射线辐射响应的实时在线测试系统

Translated title of the contribution: Real-time online test system for gamma ray radiation response of semiconductor devices
  • Yifei Mu (Inventor)
  • , Cezhou Zhao (Inventor)
  • NA

Research output: Patent

Translated title of the contributionReal-time online test system for gamma ray radiation response of semiconductor devices
Original languageChinese (Simplified)
Patent granted numberCN105974294B
Validity date5/07/36
Publication statusPublished - 27 Nov 2018

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