Total ionizing dose effects in lanthanide doped HfO2 and ultrathin HfO2 gate dielectrics

  • Zhai, Yujia (PI)
  • Zhai, Yujia (Team member)
  • Kong, Fanhua (Team member)
  • Zhao, Chun (Team member)
  • Wu, Jingjin (Team member)
  • Mu, Yifei (Team member)
  • R., Paul (Team member)
  • Taylor, Stephen (Team member)
  • Werner, Matthew (Team member)

Project: Governmental Research Project

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Chemistry

Material Science

Immunology and Microbiology