Semiconductor defect detection based on complex system big data and machine vision: methods and research

Project: Collaborative Research Project

Project Details

Project Title (In Chinese)

基于复杂系统大数据和机器视觉的半导体缺陷异常检测:方法与研究

Fund Amount (RMB)

500000.00
Project CategoryTechnology Development (Commissioned Party)
StatusActive
Effective start/end date15/10/2115/05/26

Collaborative partners

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