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Dive into the research topics where Zifeng Qu is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
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2.9-kV Enhancement-Mode GaN Monolithic Bidirectional Switch Based on Gate Post-Annealing-Free Oxygen Plasma Treatment
Qu, Z., Li, A., Xu, Y., Zhang, X., Yu, G., Long, C., Liu, W. & Wen, H., Apr 2026, In: IEEE Electron Device Letters.Research output: Contribution to journal › Article › peer-review
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High Gate Reliability and Breakdown Voltage p-GaN HEMTs Based on Post-Annealing-Free Oxygen Plasma Treatment
Qu, Z., Duan, J., Li, A., Zhang, X., Tian, H., Wu, J., Guo, Q., Zhang, Q., Jiang, Y., Luo, N., Zhang, X., Yu, G., Long, C., Liu, W. & Wen, H., Mar 2026, In: IEEE Transactions on Device and Materials Reliability.Research output: Contribution to journal › Article › peer-review
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Monolithic Integrated GaN Complementary Logic Circuits Using AlON/Al2O3 Bilayer Gate Dielectric
Zhang, X., Xu, Y., Duan, J., Qu, Z., Ji, H., Ding, C., Tian, H., Gu, J., Mitrovic, I., Zalinge, H. V., Huang, S., Zhang, J., Li, A. & Liu, W., 2026, (Accepted/In press) In: IEEE Transactions on Electron Devices.Research output: Contribution to journal › Article › peer-review
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Junction Temperature Extraction for Silicon Carbide Power Devices: A Comprehensive Review
Wen, H., Li, X., Zhang, F., Qu, Z., Jiang, Y., Luo, N., Wang, G., Wang, X., Liu, W., Cui, M. & Zhao, Y., Feb 2025, In: IEEE Transactions on Power Electronics. 40, 2, p. 3090-3111 22 p.Research output: Contribution to journal › Review article › peer-review
20 Citations (Scopus) -
Junction Temperature Measurement of GaN Device Using Short-Circuit Current as Temperature Sensitive Electrical Parameter
Qu, Z. & Wen, H., 4 Mar 2025, Proceedings of 2024 International Conference on Smart Electrical Grid and Renewable Energy, SEGRE 2024 - Volume 1. Wen, F., Liu, H., Wen, H. & Wang, S. (eds.). Springer Science and Business Media Deutschland GmbH, p. 528-534 7 p. (Lecture Notes in Electrical Engineering; vol. 1363 LNEE).Research output: Chapter in Book or Report/Conference proceeding › Conference Proceeding › peer-review