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Dive into the research topics where Ningyu Luo is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
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High Gate Reliability and Breakdown Voltage p-GaN HEMTs Based on Post-Annealing-Free Oxygen Plasma Treatment
Qu, Z., Duan, J., Li, A., Zhang, X., Tian, H., Wu, J., Guo, Q., Zhang, Q., Jiang, Y., Luo, N., Zhang, X., Yu, G., Long, C., Liu, W. & Wen, H., Mar 2026, In: IEEE Transactions on Device and Materials Reliability.Research output: Contribution to journal › Article › peer-review
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Junction Temperature Extraction for Silicon Carbide Power Devices: A Comprehensive Review
Wen, H., Li, X., Zhang, F., Qu, Z., Jiang, Y., Luo, N., Wang, G., Wang, X., Liu, W., Cui, M. & Zhao, Y., Feb 2025, In: IEEE Transactions on Power Electronics. 40, 2, p. 3090-3111 22 p.Research output: Contribution to journal › Review article › peer-review
20 Citations (Scopus)